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Synchrotron white beam x-ray topography characterization of structural defects in microgravity and ground-based CdZnTe crystals

Author(s):
Publication title:
Space processing of materials : 4-5 August 1996, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2809
Pub. Year:
1996
Page(from):
45
Page(to):
56
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421975 [0819421979]
Language:
English
Call no.:
P63600/2809
Type:
Conference Proceedings

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