Blank Cover Image

Supercurrent distribution and flux penetration in high-Tc edge Josephson junctions

Author(s):
Publication title:
Oxide superconductor physics and nano-engineering II : 30 January -2 February 1996, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2697
Pub. Year:
1996
Page(from):
470
Page(to):
478
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420718 [0819420719]
Language:
English
Call no.:
P63600/2697
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Supercurrents through the Josephson π-Junctions

Koshina, E., Krivoruchko, V.

Trans Tech Publications
7 Conference Proceedings Josephson tunneling in high-Tc superconductors

Sun,A.G., Katz,A.S., Truscott,A., Dynes,R.C., Gajewski,D.A., Han,S.H., Maple,M.B., Veal,B.W., Gu,C.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Multilayered Approach to Step-Edge Josephson Junctions

O.V. Shcherbakova, A.V. Pan, S. Fedoseev, S.X. Dou, S.K.H. Lam

Trans Tech Publications
8 Conference Proceedings Linewidth of Josephson Oscillations in YBa2Cu3O7-x Step Edge Grain Boundary Junctions

Divin Ya. Yu., Andreev V. A., Braginski I. A., Fischer M. G., Herrmann K., Mygind J., Pedersen F. N., Siegel M.

Plenum Press
3 Conference Proceedings Breakdown Voltage Characteristics of FLR-Assisted SiC-SBD Formed by Aluminum Metal Junction Edge Termination

S.J. Kim, Y.S. Choi, S.J. Yu, S.C. Kim, W. Bahng, K.H. Lee

Trans Tech Publications
9 Conference Proceedings Effect of Lattice Strain on Growth Mechanisms and Electrical Transport Behavior of Epitaxial CaRuO3 Thin Films

Eom, C. B., Rao, R. A., Gan, Q., Cava, R. J., Krajewski, J. J., Suzuki, Y., Gausepohl, S. C., Lee, M.

MRS - Materials Research Society
4 Conference Proceedings Submillimeter wave detection and mixing experiments using high temperature Josephson junctions

Chen, J., Kobayashi, E., Myoren, H., Nakajima, K., Yamashita, T., Linzen, S., Schmidl, F., Seidel, P.

SPIE
10 Conference Proceedings Studies of static and dynamic properties of multilayered(stacked)Josephson junctions

Song,S.N., Maglic,S.R., Thomas,C.D., Rippert,E.D., Auvil,P.R., Ulmer,M.P., Ketterson,J.B.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings The Optical Absorption Edge of Porous Silicon: Its Dependence on Particle Size Distribution

Choy, T.C., Stoneham, A.M.

Electrochemical Society
11 Conference Proceedings HIGH Tc TRI-LAYERS FOR JOSEPHSON JUNCTIONS

Eckstein, J.N.., Bozovic, I., Klausmeier-Brown, M.E., Virshup, G.F.

Materials Research Society
6 Conference Proceedings Exposure latitude requirements for high yield with photon flux-limited laser sources

O'Brien,S.C., Mason,M.E.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings "Mask defect disposition: flux-area measurement of edge, contact, and OPC defects correlates to wafer and enables effective decisions"

Fiekowsky,P., Taylor,D., Wang,D., Yang,C.C., Lin,S.C., Tu,L.H., Lin,K.R.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12