Vieira Soares, A.P., Farinha Portiela, M., Kiennemann, A.
Elsevier
|
Carrazan, S.R.G., Martin, C., Pedrero, C.M., Saunders, J.
Elsevier
|
Farinha-Portela, M., Pinheiro, C., Oliveira, M.
Elsevier
|
Lopez, T., Gomez, R., Castillo, S., Gonzalez, R. D.
American Institute of Chemical Engineers
|
Canevali, C., Morazzoni, F., Scotti, R., Cauzzi, D., Predieri, G., Moggi, P.
MRS - Materials Research Society
|
Diana Filkova, Bistra Savova, Maria Criŝan, Malina Raileanu, Jacques C. Védrine
|
Inga Walzel, Marcel A. Liauw, M. Estenfelder
American Institute of Chemical Engineers
|
Otsuka, K., Wang, Y., Yamanaka, I., Morikawa, A., Sinev, M. Y.
Elsevier
|
Madeira, L. M., Portela, M. F.
Elsevier
|
Yamashita, H. (Japan), Kawasaki, S. (Japan), Takeuchi, M. (Japan), Fujii, Y. (Japan), Ichihashi, Y. (Japan), Suzuki, Y. …
Elsevier
|
T. Miki, K. Yoshimura, Y. Tai, M. Tazawa, P. Jin
Society of Photo-optical Instrumentation Engineers
|
Machiels, C. J., Chowdhry, U., Harrison, W. T. A., Sleight, A. W.
American Chemical Society
|