Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction

Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction

Author(s):

Publication title:

European powder diffraction : EPDIC IV : proceedings of the Fourth European Powder Diffraction Conference, held in Chester, England, July 1995

Title of ser.:

Materials science forum

Ser. no.:

228-231

Pub. Year:

1996

Pt.:

1

Page(from):

301

Page(to):

306

Pub. info.:

Zuerich-Uetikon, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878497423 [0878497420]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00020692
Series ID:	PA00000012
Conf. info. (Name):	European Powder Diffraction Conference : EPDIC
Conf. info. (Number):	4th
Conf. info. (Venue):	Chester, England, UK
Conf. info. (Date):	1995.07.00

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