Blank Cover Image

The Titanium and Vanadium Donor in CdTe

Author(s):
Christmann,P.
Kreissl,J.
Hoffmann,D.M.
Meyer,B.K.
Schwarz,R.
Benz,K.W.
1 more
Publication title:
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
Title of ser.:
Materials science forum
Ser. no.:
196-201
Pub. date:
1995
Pt.:
2
Page(from):
779
Page(to):
783
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497164 [0878497161]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Stadler, W., Meyer, B.K., Hofmann, D.M., Sinerius, D., Benz, K.W.

Materials Research Society

Schwarz, R., Laasch, M., Benz, K. W.

MRS - Materials Research Society

Meyer, B.K., Hofmann, D.M., Eckstein, J., Benz, K.W.

Materials Research Society

Meyer, B.K., Hofmann, D.F., Oettinger, K., Stadler, W., Efros, Al. L., Salk, M., Benz, K.W.

Materials Research Society

Hofmann,D.M., Meyer,B.K., Christmann,P., Wimbauer,T., Stadler,W., Nikolov,A., Scharmann,A., Hofstatter,A.

Trans Tech Publications

Ganichev,S.D., Yassievich,I.N., Prettl,W., Diener,J., Meyer,B.K., Benz,K.W.

Trans Tech Publications

Hofmann,D.M., Meyer,B.K., Pawlik,T., Alteheld,P., Spaeth,J.-M.

Trans Tech Publications

Stadler,W., Meyer,B.K., Volm,D., Hofmam,D.M., Hoffmann,A., Wiesmann,D., Heitz,R., Kurtz,E., Hommel,D.

Trans Tech Publications

Stadler,W., Meyer,B.K., Hofmann,D.M., Kowalski,B., Emanuelsson,P., Omling,P., Weigl,E., Miiller-Vogt,G., Cox,R.T.

Trans Tech Publications

Meyer, B.K., Hofmann, D.M., Stadler, W., Emanuelsson, P., Omling, P., Weigel, E., Muller-Vogt, G., Wienecke, F., Schenk, …

Materials Research Society

Hoschl,P., Grill,R., Franc,J., Belas,E., Turjanska,L., Turkevych,I., Benz,K.W., Fiederle,M.

SPIE-The International Society for Optical Engineering

Meyer, B.K., Christmann, P., Stadler, W., Overhof, H., Spaeth, J-M., Greulich-Weber, S., Stich, B.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12