HVEM in Situ Investigation of Stress-Induced Grain Growth During Thermal Annealing of Thin Al-Alloy Films on a Si/SiO2 Substrate

HVEM in Situ Investigation of Stress-Induced Grain Growth During Thermal Annealing of Thin Al-Alloy Films on a Si/SiO2 Substrate

Author(s):

Publication title:

Grain growth in polycrystalline materials : proceedings of the 1st International Conference on Grain Growth in Polycrystalline Materials, held in Rome, Italy, 18-21 June, 1991

Title of ser.:

Materials science forum

Ser. no.:

94-96

Pub. Year:

1992

Vol.:

Pt.2

Page(from):

551

Page(to):

556

Pub. info.:

Zurich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496402 [0878496408]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00020686
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Grain Growth in Polycrystalline Materials
Conf. info. (Number):	1st
Conf. info. (Venue):	Rome, Italy
Conf. info. (Date):	1991.06.18-1991.06.21

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