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Automated inspection and dimension measurement of optoelectronic components

Author(s):
  • Lim,T.-K. ( Nanyang Technological Univ.(Singapore) )
  • Swaminathan,S. ( Nanyang Technological Univ.(Singapore) )
  • Woo,C.K. ( EG & G Heimann Optoelectronics Pte.Ltd.(Singapore) )
  • Chan,C.N. ( Nanyang Technological Univ.(Singapore) )
  • Wong,Y.K. ( Nanyang Technological Univ.(Singapore) )
Publication title:
Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3185
Pub. Year:
1997
Page(from):
32
Page(to):
41
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426123 [0819426121]
Language:
English
Call no.:
P63600/3185
Type:
Conference Proceedings

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