Attributes and drawbacks of submicron CMOS for IR FPA readouts

Attributes and drawbacks of submicron CMOS for IR FPA readouts

Author(s):: Kozlowski,L.J. ( Rockwell Science Ctr. )
Publication title:: Infrared readout electronics IV : 13 April 1998, Orlando, Florida
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 3360
Pub. Year:: 1998
Page(from):: 91
Page(to):: 100
Pub. info.:: Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819428097 [0819428094]
Language:: English
Call no.:: P63600/3360
Type:: Conference Proceedings

Details

TDL ID:	ZA00020639
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Infrared Readout Electronics
Conf. info. (Number):	1997 : 4th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1998.04.13

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