Blank Cover Image

"Reflection Shear Force/Near-Field Scanning Optical Microscopy (NSOM) "

Author(s):
Publication title:
Near field optics
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
242
Pub. Year:
1993
Page(from):
45
Page(to):
50
Pages:
6
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792323945 [0792323947]
Language:
English
Call no.:
N11482/242
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings "Sensing Tip Morphology in Scanning Optical Microscopes"

Paesler A. M., Buckland L. E., Moyer J. P., Yakobson I. B.

Kluwer Academic Publishers
7 Conference Proceedings Use of near-field scanning optical microscopy(NSOM)to characterize optical channel waveguide structures

Naghski,D.H., Lindsay,S.M., Poweleit,C.D., Brabander,G.N.De, Subramaniam,V., Jackson,H.E., Boyd,J.T.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings "Principles and Applications of Near-Field Scanning Optical Microscopy (NSOM)"

Betzig E.

Kluwer Academic Publishers
8 Conference Proceedings Effect of the radiation reaction force on infrared signals from the apertureless near field scanning optical microscopy technique [6008-53]

Chang M. P. J. L., Roura E. A.

SPIE - The International Society of Optical Engineering
3 Conference Proceedings "Fiber Tips for Reflection Scanning Near-Field Optical Microscopy"

Tomanek P.

Kluwer Academic Publishers
9 Conference Proceedings Biological applications of near-field scanning optical microscopy

M.H.P. Moers, A.G.T. Ruiter, A. Jalocha, N.F. van Hulst, W.H.J. Kalle

Society of Photo-optical Instrumentation Engineers
4 Conference Proceedings Fluorescence scanning near-field optical microscopy in reflection

A. Jalocha, M.H.P. Moers, N.F. van Hulst

Society of Photo-optical Instrumentation Engineers
10 Conference Proceedings Numerical comparison between shear force,constant height,and constant intensity images in scanning near-field optical microscopy

Xiao,M., Chen,X.

SPIE - The International Society for Optical Engineering
5 Conference Proceedings Micromachined aperture probe for combined atomic force and near-field scanning optical microscopy (AFM/NSOM)

Drews,D., Noell,W., Ehrfeld,W., Lacher,M., Mayr,K., Marti,O., Serwatzy,C., Abraham,M.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Novel nonoptical method of tip-sample distance regulation based on shear force in scanning near-field optical microscopy

Liu,X., Wang,J., Li,D.

SPIE - The International Society for Optical Engineering
6 Conference Proceedings "A Scanning Near-Field Optical Microscopy with Optical Distance Control"

Hrynevych M., Butler J. D., Nugent A. K., Roberts A.

Kluwer Academic Publishers
12 Conference Proceedings Near-field optical microscopy:application to investigation of surface laser-induced damage of transparent optical materials

Gruzdev,V.E., Libenson,M.N., Martsinovsky,G.A., Paesler,M.A., Soileau,M.J., Yacobson,B.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12