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An Experimental and Theoretical Investigation of Degradation in Semiconductor Lasers Resulting from Electrostatic Discharge

Author(s):
Publication title:
Semiconductor device reliability
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
175
Pub. date:
1990
Page(from):
379
Page(to):
411
Pages:
33
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792305361 [0792305361]
Language:
English
Call no.:
N11482/175
Type:
Conference Proceedings

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