An Experimental and Theoretical Investigation of Degradation in Semiconductor Lasers Resulting from Electrostatic Discharge
- Author(s):
- Dechiaro F. L. ( Bell Communications Research, U. S. A. )
- Brick-Podriguez D. C. ( South Central Bell, U. S. A. )
- Chemelli G. R.
- Krupsky W. J.
- Publication title:
- Semiconductor device reliability
- Title of ser.:
- NATO ASI series. Series E, Applied sciences
- Ser. no.:
- 175
- Pub. Year:
- 1990
- Page(from):
- 379
- Page(to):
- 411
- Pages:
- 33
- Pub. info.:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9780792305361 [0792305361]
- Language:
- English
- Call no.:
- N11482/175
- Type:
- Conference Proceedings
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