Blank Cover Image

High Resolution Electron Microscopy Study of Indium Distribution In InAs/GaAs Multilayers

Author(s):
Publication title:
Evaluation of advanced semiconductor materials by electron microscopy
Title of ser.:
NATO ASI series. Series B, Physics
Ser. no.:
203
Pub. Year:
1989
Page(from):
47
Page(to):
58
Pages:
12
Pub. info.:
New York: Plenum Press
ISBN:
9780306433627 [0306433621]
Language:
English
Call no.:
N11479/203
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings InAs quantum boxes: Active probes for air/GaAs photonic bandgap microstructures

Gerard M. J., Barrier D., Marzin Y. J.

Kluwer Academic Publishers
7 Conference Proceedings HIGH RESOLUTION ELECTRON MICROSCOPY STUDY OF AS-PREPARED AND ANNEALED TUNGSTEN-CARBON MULTILAYERS

Nguyen, Tai D., Gronsky, Ronald, Korrtright, Jeffrey B.

Materials Research Society
2 Conference Proceedings Nucleation and growth of InAs islands on GaAs: An optical study

Gerard -M. J., Genin B. J., Lefebvre J., Marzin Y. J., Barrier D., Moison M. J.

Kluwer Academic Publishers
8 Conference Proceedings APPLICATION OF HIGH-RESOLUTION ELECTRON MICROSCOPY TO THE STUDY OF MAGNETIC THIN FILMS AND MULTILAYERS

Sinclair, R., Nolan, T. P., Bertero, G. A., Visokay, M. R.

MRS - Materials Research Society
3 Conference Proceedings Mid-Infrared Intraband Transitions in Self-Organized InAs/GaAs Quantum Dots

Boucaud, P., Sauvage, S., Julien, F.H., Gerard, J.-M., Marzin, J.-Y.

Electrochemical Society
9 Conference Proceedings HIGH-RESOLUTION ELECTRON MICROSCOPY STUDIES OF Co/Cr MULTILAYERS

Tsen, Shu-Chen Y., Stearns, Mary Beth, Smith, David J.

Materials Research Society
4 Conference Proceedings HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY STUDY OF Se+ IMPALNATED AND ANNEALED GaAs

Sadana, D. K., Sands, T., Washburn, J.

North-Holland
10 Conference Proceedings High-Resolution Transmission Electron Microscopy Study of Metallic Spin-Glass/Amorphous Silicon Multilayers

Howell, David A., Crimp, Martin A., Hoines, Lilian M., Bass, J.

MRS - Materials Research Society
5 Conference Proceedings X-RAY-0PTICAL MULTILAYER STRUCTURES STUDIES USING HIGH RESOLUTION ELECTRON MICROSCOPY

Stearns, Mary Beth, Petford-Long, Amanda K., Chang, C.-H., Stearsn, D.G., Ceglio, N.M., Hawryluk, A.M.

Materials Research Society
11 Conference Proceedings HIGH RESOLUTION ELECTRON MICROSCOPY STUDIES OF MBE GROWN InSb LAYERS ON GaAs (100)

Kiely, C.J., Chyi, J-I., Rokett, Chyi A,, Morkoc, H.

Materials Research Society
6 Conference Proceedings Structure of InAs quantum dots in Si matrix investigated by high resolution electron microscopy

Zakharov, N. D., Werner, P., Ustinov, V. M., Kovsh, A. R., Cirlin, G. E., Smolski, O. V., Denisov, D. V., Alferov, Zh. …

MRS-Materials Research Society
12 Conference Proceedings Optical Testing of Probability Densities in Quantum Well Eigenstates

Marzin Y. J., Gerard M. J.

Plenum Press
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12