Zigterman J. W. J. G., Verheul M. F. A., Snippe H.
Plenum Press
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Storm G., Bakker-Woudenberg M. J. A. I., Woodle C. M., blume G., nassander K. U., Vingerhoeds H. M., Haisma H., …
Plenum Press
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Harm Snippe, Wouter T. M. Jansen, Johannis P. Kamerling
American Chemical Society
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Perrie,Y., Gregoriadis,G.
IOS Press
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Snippe H., Alonso de Velasco E., Verheul M. F. A., Poolman T. J.
Plenum Press
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F. Chen, C. Chan, K. Liu, Y. Huang, H. Peng, H. Chang, T. Yew, K. Y. Hsu, L. Hsu
SPIE - The International Society of Optical Engineering
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Malcolm J. Andrew, Best W. Michael, Szarka J. roderick, Mosleh Zina, Unger M. Frank, Messner Paul, Sleytr B. Uwe
Plenum Press
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Alving R. C., Richards L. R., Hayre D. M., Hockmeyer T. W., Wirtz A. R.
Plenum Press
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Shannon Haughney, Latrisha Petersen, Janice King, Amanda Ramer-Tait, Amy Schoofs
American Institute of Chemical Engineers
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Chan, C.-H., Fan, C.-C., Huang, Y.-J., Peng, H.-L., Hsu, L.
SPIE - The International Society of Optical Engineering
|
Snippe H., Fernandez M. I., Kraaijeveld A. C.
Plenum Press
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Shannon Haughney, Janice King, David Briles, Paul Lueth, Bryan H. Bellaire
American Institute of Chemical Engineers
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