
Partially strained Si1-xGex/Si structures investigated by photoreflectance spectroscopy
- Author(s):
- Sitarek,P. ( Wroclaw Univ.of Technology )
- Misiewicz,J.
- Nauka,K.
- Publication title:
- Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3725
- Pub. date:
- 1999
- Page(from):
- 214
- Page(to):
- 217
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819431998 [0819431990]
- Language:
- English
- Call no.:
- P63600/3725
- Type:
- Conference Proceedings
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