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FT-IR interferogram sampling validation and correction

Author(s):
Publication title:
Electro-optic, integrated optic, and electronic technologies for online chemical process monitoring : 2-5 November 1998, Boston, Massachusetts
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3537
Pub. Year:
1999
Page(from):
181
Page(to):
186
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819429988 [0819429988]
Language:
English
Call no.:
P63600/3537
Type:
Conference Proceedings

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