Measurements with the Chandra X-ray Observatory's flight contamination monitor

Measurements with the Chandra X-ray Observatory's flight contamination monitor

Author(s):

Elsner,R.F. ( NASA Marshall Space Flight Ctr. )

Publication title:

X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4012

Pub. Year:

2000

Page(from):

612

Page(to):

618

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819436375 [0819436372]

Language:

English

Call no.:

P63600/4012

Type:

Conference Proceedings

Details

TDL ID:	ZA00020372
Series ID:	PA00000029
Conf. info. (Name):	Astronomical Telescopes and Instrumentation : X-ray optics, instruments, and missions
Conf. info. (Number):	2000 : 3rd
Conf. info. (Venue):	Munich, Germany
Conf. info. (Date):	2000.03.27-2000.03.29

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