In-flight performance and calibration of the Chandra high-resolution camera spectroscopic readout(HRC-S)
- Author(s):
Kraft,R.P. ( Harvard-Smithsonian Ctr.for Astrophysics ) Chappell,J.H. Kenter,A.T. Meehan,G.R. Murray,S.S. Zombeck,M.V. Donnelly,R.H. Drake,J.J. Johnson,C.O. Juda,M. Patnaude,D. Pease,D.O. Ratzlaff,P.W. Wargelin,B.J. Austin,G.K. Fraser,G.W. Pearson,J.F. Lees,J.E. Brunton,A.N. - Publication title:
- X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4012
- Pub. Year:
- 2000
- Page(from):
- 493
- Page(to):
- 517
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436375 [0819436372]
- Language:
- English
- Call no.:
- P63600/4012
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
In-flight performance and calibration of the Chandra high-resolution camera imager(HRC-I)
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE |
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Performance and calibration of the AXAF High-Resolution Camera I: imaging readout
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Improving Chandra High-Resolution Camera event posltions via corrections to crossed-grid charge detector signals
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
AXAF High-Resolution Camera (HRC): calibration and recalibration at XRCF and beyond
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
5
Conference Proceedings
Event screening for the Chandra X-Ray Observatory High-Resolution Camera (HRC)
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Performance and calibration of the AXAF High-Resolution Camera II: the spectroscopic detector
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Synchrotron measurements of the absolute X-ray quantum efficiency of CsI-coated microchannel plates
SPIE |