Orbital measurement and verification of the Chandra X-ray Observatory's PSF
- Author(s):
Jerius,D. ( Smithsonian Astrophysical Observatory ) Donnelly,R.H. Tibbetts,M.S. Edgar,R.J. Gaetz,T.J. Schwartz,D.A. Speybroeck,L.P.Van Zhao,P. - Publication title:
- X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4012
- Pub. Year:
- 2000
- Page(from):
- 17
- Page(to):
- 27
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436375 [0819436372]
- Language:
- English
- Call no.:
- P63600/4012
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Orbital verification of the CXO high-resolution mirror assembly alignment and vignetting
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Verification of the coating performance for the AXAF flight optics based on reflectivity measurements of coated witness samples
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Absolute effective area of the Chandra high-resolution mirror assembly(HRMA)
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |