THICKNESS DEPENDENCE OF ELECTRICAL TRANSPORT IN BURIED CoSi2 FILMS FABRICATED BY ION BEAM SYNTHESIS
- Author(s):
Radermacher, K. Jebasinski, R. Mantl, S. Monroe, D. White, A. E. Short, K. T. - Publication title:
- Silicides, germanides, and their interfaces : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 320
- Pub. Year:
- 1994
- Page(from):
- 209
- Pub. info.:
- Pittsburgh, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992191 [1558992197]
- Language:
- English
- Call no.:
- M23500/320
- Type:
- Conference Proceedings
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