Blank Cover Image

Effect of Al, Ta, and O Precursors on Growth and Properties of Al2O3 and Ta2O5 Thin Films Deposited by Triode PECVD

Author(s):
Publication title:
Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
567
Pub. Year:
1999
Page(from):
445
Pub. info.:
Warrendale, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994744 [1558994742]
Language:
English
Call no.:
M23500/567
Type:
Conference Proceedings

Similar Items:

Souk, J.H., Parsons, G.N., Batey, J.

Materials Research Society

Hendrix, B. C., Hintermaier, F., Desrochers, D. A., Roeder, J. F., Baum, T. H., Dehm, C., Nagel, N., Honlein, W., …

MRS - Materials Research Society

Park, Jong-Wan, Han, S. W., Moon, H. S., Lee, J. S.

MRS - Materials Research Society

Tan, T., Huang, J., Zhan, M., Tian, G., Shao, J., Fan, Z.

SPIE - The International Society of Optical Engineering

Banreca, D., Barrison, G.A., Genhasi, R., Tondello, E.

Electrochemical Society

Shimizu, M., Fujisawa, H., Hyodo, S., Nakashima, S., Niu, H., Okino, H., Shiosaki, T.

MRS - Materials Research Society

Z. Brankovic, G. Brankovic, K. Vojisavljevic, M. Pocuca, T. Sreckvic, D. Vasiljevic-Radovic

Trans Tech Publications

P. Fayet, B. Jaccoud, R. Davis, D. Klein

Society of Vacuum Coaters

Fork, D.K., Geballe, T.H., Char, K., Laderman, S.S., Taber, R., Bridges, F., Ponce, F., Boyce, J.B., Connell, G.A.N.

Materials Research Society

Christos G. Takoudis

American Institute of Chemical Engineers

Seo,H., Jeong,T.-H., Park,J.-W., Yeon,C., Lee,D.-C., Kim,S.-J., Lim,H.-J., Kim,S.-Y.

SPIE - The International Society for Optical Engineering

Fe, L., Malic, B., Norga, G., Kosec, M., Wouters, D. J., Bartic, T. A., Maes, H. E.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12