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Understanding Structure and Electronic Properties of Extended Self-Interstitial Defects in Silicon

Author(s):
Publication title:
Multiscale modelling of materials : symposium held November 30-December 3, 1998, Boston, Massachusets, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
538
Pub. Year:
1999
Page(from):
353
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994447 [1558994440]
Language:
English
Call no.:
M23500/538
Type:
Conference Proceedings

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