Measurements of the Diffusion of Iron and Carbon in Single-Crystal NiAl Using Ion Implantation and Secondary Ion Mass Spectrometry

Measurements of the Diffusion of Iron and Carbon in Single-Crystal NiAl Using Ion Implantation and Secondary Ion Mass Spectrometry

Author(s):

Publication title:

Diffusion mechanisms in crystalline materials : symposium held April 13-16, 1998, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

527

Pub. Year:

1998

Page(from):

227

Pub. info.:

Warrendale, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558994331 [1558994335]

Language:

English

Call no.:

M23500/527

Type:

Conference Proceedings

Details

TDL ID:	ZA00020315
Series ID:	PA00000011
Conf. info. (Name):	Symposium on diffusion mechanisms in crystalline materials
Conf. info. (Number):	1998
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1998.04.13-1998.04.16

Similar Items:

1 Conference Proceedings Phosphorus / Silicon Interstitial Annealing After Ion Implantation Keys, P. H., Brindos, R., Krishnamoorthy, V., Puga-Lambers, M., Jones, K. S., Law, Mark E. Materials Research Society	7 Conference Proceedings Molecular Secondary Ion Mass Spectrometry Pachuta, Steven J., Cooks, R. Graham American Chemical Society
2 Conference Proceedings OXIDE FORMATION ON NbAl3 AND TiAl DUE TO ION IMPLANTATION OF 18O Hanrahan, Robert J., Jr., Verink, Ellis D., Jr., Withrow, Stephen P., Ristolainen, Eero O. MRS - Materials Research Society	8 Conference Proceedings Surface Sensitivity of Electron Energy Loss Spectroscopy and Secondary-Ion Mass Spectrometry of Organic Films Pomerantz, M., Purtell, R. J., Twieg, R. J., Chuang, S.-F., Reuter, W., Eldridge, B. N., Novak, F. P. American Chemical Society
3 Conference Proceedings ACCUMULATION OF IMPLANTATION DAMAGE IN MeV IMPLANTED DIAMOND CRYSTALS Hunn, John D., Withrow, S. P., Clausing, R. E., Heatherly, L., Bentley, J., Hembree, D. M., Jr., Parikh, N. R. MRS - Materials Research Society	9 Conference Proceedings Formation of Ferromagnetic FePt Nanoparticles by Ion Implantation White, C.W., Withrow, S.P., Budai, J.D., Boatner, L.A., Sorge, K.D., Thompson, J.R., Beaty, K.S., Meldrum, A. Materials Research Society
4 Conference Proceedings HIGH TEMPERATURE IMPLANTATION OF SINGLE CRYSTAL BETA SILICON CARBIDE THIN FILMS Edmond, J.A., Withrow, S.P., Wadlin, W., Davis, R.F. Materials Research Society	10 Conference Proceedings Ion Implantation and Secondary Ion Mass Spectrometry of Compound Semiconductors Wilson, R G. Electrochemical Society
5 Conference Proceedings Semiquantitative analysis of atherosclerotic plaque using optical coherence tomography and time-of-flight secondary ion mass spectrometry Korol, R.M., Togonu-Bickersteth, B., Yang, V.X., Dimov, S., Vatsya, P., Gordon, M., Vitkin, A., Liu, L., Canham, P., … SPIE-The International Society for Optical Engineering	11 Conference Proceedings Photon burst mass spectrometry for the measurement of 85Kr at ambient levels Fairbank,W.M.,Jr., Hansen,C.S., LaBelle,R.D., Pan,X.-J., Zhang,Y., Chamberlin,E.P., Nogar,N.S.(deceased), Miller,C.M., … SPIE-The International Society for Optical Engineering
6 Conference Proceedings Characterization of TiAl Alloys by Secondary Ion Mass Spectrometry Barbosa, J., Teodoro, O.M.N.D., Moutinho, A.M.C., Ribeiro, S., Monteiro, C. Trans Tech Publications	12 Conference Proceedings INVESTIGATION OF TITANIUM SILICIDE FORMATION USING SECONDARY ION MASS SPECTROMETRY Wee, A. T. S., Huan, A. C. H., Thian, W. H., Tan, K. L., Hogan, R. MRS - Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12