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Direct Measurement of Electron Drift Parameters Using Depth-Sensing Single-Carrier CdZnTe Detectors

Author(s):
Publication title:
Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
487
Pub. Year:
1997
Page(from):
89
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993921 [1558993924]
Language:
English
Call no.:
M23500/487
Type:
Conference Proceedings

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