Direct Measurement of Electron Drift Parameters Using Depth-Sensing Single-Carrier CdZnTe Detectors
- Author(s):
- Publication title:
- Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 487
- Pub. Year:
- 1997
- Page(from):
- 89
- Pub. info.:
- Pittsburgh, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993921 [1558993924]
- Language:
- English
- Call no.:
- M23500/487
- Type:
- Conference Proceedings
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