Megasonic Irradiation-Induced Chemical Reaction in the Solution for Silicon Wafer Cleaning
- Author(s):
- Publication title:
- Science and technology of semiconductor surface preparation : symposium held April 1-3, 1997, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 477
- Pub. Year:
- 1997
- Page(from):
- 3
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993815 [1558993819]
- Language:
- English
- Call no.:
- M23500/477
- Type:
- Conference Proceedings
Similar Items:
Electrochemical Society |
7
Conference Proceedings
SUPRESSION OF SURFACE MICRO-ROUGHNESS OF SILICON WAFER BY ADDITION OF ALCOHOL INTO ULTRA PURE WATER FOR RINSING PROCESS
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
10
Conference Proceedings
Parameters affecting megasonic power transmittance in the megasonic cleaning process
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
11
Conference Proceedings
COMPARISON OF CLEANING EFFICIENCIES OF NOBEL METALS ON Si SURFACES BETWEEN O3-UPW AND SPM
Electrochemical Society |
6
Conference Proceedings
PARTICLE AND METALLIC IMPURITIES REMOVAL BY USING NEW SPIN CLEANER BASED ON UCT CLEANING CONCEPT
Electrochemical Society |
MRS - Materials Research Society |