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HIGH-RESOLUTION X-RAY DIFFRACTION MEASUREMENTS OF SiGe/Si STRUCTURES

Author(s):
Publication title:
Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
375
Pub. date:
1995
Page(from):
201
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992771 [1558992774]
Language:
English
Call no.:
M23500/375
Type:
Conference Proceedings

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