X-RAY SCATTERING STUDIES OF INTERFACIAL MICROSTRUCTURES IN InxGa1-xAs/GaAs SUPERLATTICES

X-RAY SCATTERING STUDIES OF INTERFACIAL MICROSTRUCTURES IN InxGa1-xAs/GaAs SUPERLATTICES

Author(s):

Ming, Z. H.

Publication title:

Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

375

Pub. Year:

1995

Page(from):

171

Pub. info.:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992771 [1558992774]

Language:

English

Call no.:

M23500/375

Type:

Conference Proceedings

Details

TDL ID:	ZA00020301
Series ID:	PA00000011
Conf. info. (Name):	Symposium on applications of synchrotron radiation techniques to materials science
Conf. info. (Number):	2nd
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1994.11.27-1994.12.02

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