Detection of subsurface damage:studies in sapphire

Detection of subsurface damage:studies in sapphire

Author(s):

Black,D.R. ( National Institute of Standards and Technology )
Polvani,R.S.
Braun,L.M.
Hockey,B.J.
White,G.S.

Publication title:

Window and Dome Technologies and Materials V

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3060

Pub. Year:

1997

Page(from):

102

Page(to):

114

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424754 [0819424757]

Language:

English

Call no.:

P63600/3060

Type:

Conference Proceedings

Details

TDL ID:	ZA00020296
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Window and Dome Technologies and Materials
Conf. info. (Number):	1997 : 5th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1997.04.21-1997.04.22

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