Characterization of a fully depleted CCD on high-resistivity silicon | 東京工業大学附属図書館文献データベース

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Characterization of a fully depleted CCD on high-resistivity silicon

Author(s):

Stover,R.J. ( Univ.of California Lick Observatory )

Publication title:

Solid state sensor arrays : development and applications : 10-11 February 1997, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3019

Pub. Year:

1997

Page(from):

183

Page(to):

188

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424303 [0819424307]

Language:

English

Call no.:

P63600/3019

Type:

Conference Proceedings

Details

TDL ID:	ZA00020292
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Solid State Sensor Arrays
Conf. info. (Number):	1997
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1997.02.10-1997.02.11

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