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Reflection Grating Spectrometer on board XMM

Author(s):
Brinkman,A.C. ( Space Research Organization Netherlands )
Aarts,H.J.M.
Boggende,A.J.F.den
Bootsma,T.M.V.
Dubbeldam,L.
Herder,J.W.den
Kaastra,J.S.
Korte,P.A.J.de
Leeuwen,B.J.van
Mewe,R.
Zwet,E.J.van
Decker,T.A.
Hailey,C.J.
Kahn,S.M.
Pratuch,S.M.
Rasmussen,A.
Branduardi-Raymont,G.
Guttridge,P.
Bixler,J.V.
14 more
Publication title:
EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2808
Pub. Year:
1996
Page(from):
463
Page(to):
480
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421968 [0819421960]
Language:
English
Call no.:
P63600/2808
Type:
Conference Proceedings

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