Blank Cover Image

Measurement of the Linear Eletro-Optic Effect by Reflection Method in Mach-Zehnder Interferometer,

Author(s):
Publication title:
Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2778
Pub. Year:
1996
Vol.:
Part2
Page(from):
842
Page(to):
843
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421647 [0819421642]
Language:
English
Call no.:
P63600/2778
Type:
Conference Proceedings

Similar Items:

Wu,J.W., Cho,H.R., Shin,M.J., Han,S.H.

SPIE-The International Society for Optical Engineering

Han,S.H., Wu,J.W.

SPIE-The International Sosiety for Optical Engineering

Kim,J.H., Chang,H.J., Han,S.H., Wu,J.W.

SPIE-The International Society for Optical Engineering

Cho, S.H., Hong, S.H., Han, J.W., You, B.D.

Trans Tech Publications

Samson,S., Li,W., Tavlykaev,R., Ramaswamy,R.V.

SPIE-The International Society for Optical Engineering

Swart,P.L., Spammer,S.J., Theron,D.C.

SPIE-The International Society for Optical Engineering

Liang, F., Zeng, H.P., Wu, L., Ling, J.W.

SPIE-The International Society for Optical Engineering

Chen M.-H, Chang K.-S, Lin W.-W, Chen H.-Y, Liu S.-X

SPIE - The International Society of Optical Engineering

Han, S.H., Wu, J.W., Kang, J.-W., Shin, Y.-D., Lee, J.-S., Kim, J.-J.

SPIE-The International Society for Optical Engineering

S. Fu, P. Shum, W. C. Shin, C. Wu, Y. Li

Society of Photo-optical Instrumentation Engineers

Yue,Z.Z., Tang,S., Chen,R.T.

SPIE-The International Society for Optical Engineering

Chun,B.C., Cha,S.H., Chung,Y-C., Park,M.J., Cho,J.W.

Society of Plastic Engineers.

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12