Blank Cover Image

An Intelligent System for the Measurement of Surface Microstructure,

Author(s):
Publication title:
Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2778
Pub. Year:
1996
Vol.:
Part1
Page(from):
181
Page(to):
182
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421647 [0819421642]
Language:
English
Call no.:
P63600/2778
Type:
Conference Proceedings

Similar Items:

Wu, J., Ding, H., Wang, G.

SPIE - The International Society of Optical Engineering

Wang,G., Ding,Z., Fan,Z., Gao,R., Gan,F.

SPIE-The International Society for Optical Engineering

S. Ding, K.F. Zhang, G.F. Wang

Trans Tech Publications

Vachtsevanos,G., Wang,P., Khiripet,N., Thakker,A., Galie,T.R.

SPIE-The International Society for Optical Engineering

Wang, Y., Guan, S., Ding, Y., Fu, J., Huang, W.

SPIE-The International Society for Optical Engineering

X.M. Pan, N. Zhao, R.F. Ding, G.L. Wei, L. Wang

Trans Tech Publications

C. Yuan, C. Jiang, G. Wang

Society of Photo-optical Instrumentation Engineers

Li, L., Yang, C., Ding, H., Du, L., Liu, X., Wang, G., Song, H., Zhang, P.

Trans Tech Publications

Wang, X.D.

SPIE-The International Society for Optical Engineering

K. Zeng, Y. Ma, X. Ding

ESA Communications

Wang,J.

SPIE - The International Society for Optical Engineering

F. Jia, Z. Ding, F. Yuan

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12