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Graphical Interpretation of Input/Output Relationships for SISO and MIMO Measurements

Author(s):
Publication title:
Proceedings of the 14th International Modal Analysis Conference February 12-15, 1996 Hyatt Regency Dearborn Hotel Dearborn, Michigan
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2768
Pub. Year:
1996
Page(from):
1332
Page(to):
1341
Pub. info.:
Bethel, CT: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780912053493 [0912053496]
Language:
English
Call no.:
P63600/2768
Type:
Conference Proceedings

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