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Modal Analysis of The Chinese Standard Structure Using Varied Excitation Methods

Author(s):
Luk,Y.W. ( Zonic Corporation )
Coleman,R.E.
Zhang,W.X.
Xu,B.X.
Luo,J.
Liao,Q.W.
1 more
Publication title:
Proceedings of the 14th International Modal Analysis Conference February 12-15, 1996 Hyatt Regency Dearborn Hotel Dearborn, Michigan
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2768
Pub. date:
1996
Page(from):
8
Page(to):
15
Pub. info.:
Bethel, CT: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780912053493 [0912053496]
Language:
English
Call no.:
P63600/2768
Type:
Conference Proceedings

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