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Method of multilayer semiconductor structures cross section preparation for transmission electron microscopy

Author(s):
Publication title:
Process, Equipment, and Materials Control in Integrated Circuit Manufacturing
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2637
Pub. Year:
1995
Page(from):
233
Page(to):
236
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420039 [0819420034]
Language:
English
Call no.:
P63600/2637
Type:
Conference Proceedings

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