Xu Li, Haider Almkhelfe, Jenae Tate, Jingyi Xie, Keith L. Hohn
American Institute of Chemical Engineers
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J. Ruud van Ommen, David Vervloet, John Nijenhuis, Freek Kapteijn
American Institute of Chemical Engineers
|
Zhan,C., Wu,J., Li,X., Yang,X., Qin,J.
SPIE-The International Society for Optical Engineering
|
Stockman, M.I., Li, K., Li, X., Bergman, D.J.
SPIE - The International Society of Optical Engineering
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P.B. Radstake, J.P. den Breejen, G.L. Bezemer, J.H. Bitter, K.P. de Jong, V. Frøseth, A. Holmen
Elsevier
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Shi, H. -B., Li, Q., Dai, X. -P., Yu, C. -C., Shen, S. -K.
Elsevier
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Anderson, Robert B.
American Chemical Society
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Klabunde K. J., Li Y. X., Khaleel A.
Kluwer Academic Publishers
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Yang, H., Li, R., Xie, K.
Elsevier
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Wang,J., Xie,S., Zhang,Y., Li,W.
SPIE-The International Society for Optical Engineering
|
Irons, S.H., Nemchuk, N.I., Rohrs, H.W., Kowalewski, T., Faircioth, B.O., Krchnavek, R.R., Ruoff, R.S.
Electrochemical Society
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K. Aatre, J. Xie, L. F. Chen, J. K. Abraham, V. K. Varadan
Society of Photo-optical Instrumentation Engineers
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