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Characterization of Residual Transition Metal Ions in GaN and AlN

Author(s):
Baur,J.
Kaufinann,U.
Kunzer,M.
Schneider,J.
Amano,H.
Akasaki,I.
Detchprohm,T.
Hiramatsu,K.
3 more
Publication title:
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
Title of ser.:
Materials science forum
Ser. no.:
196-201
Pub. date:
1995
Pt.:
1
Page(from):
55
Page(to):
60
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497164 [0878497161]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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