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Carrier Localization in Gallium Nitride

Author(s):
Wetzel,C.
Walukiewicz,W.
Haller,E.E.
Ager,J.W.III
Chen,A.
Fischer,S.
Yu,P.Y.
Jeanloz,R.
Grzegory,I.
Porowski,S.
Suski,T.
Amano,H.
Akasaki,I.
8 more
Publication title:
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
Title of ser.:
Materials science forum
Ser. no.:
196-201
Pub. Year:
1995
Pt.:
1
Page(from):
31
Page(to):
36
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497164 [0878497161]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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