Blank Cover Image

Laser-Aided Measurements of Electric Fields on III-V Semiconductor Structures Using Modulation Spectroscopy:Solar Cell P-N Junctions and [111] Strained Layer Superlattices

Author(s):
Publication title:
Semiconductor processing and characterization with lasers : applications in photovoltaics : proceedings of the First International Symposium, Stuttgart, Germany, April 18-20, 1994
Title of ser.:
Materials science forum
Ser. no.:
173-174
Pub. Year:
1995
Page(from):
355
Page(to):
360
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496839 [0878496831]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Rodrigues, R. G., Yang, K., Schowalter, L. J., Borrego, J. M.

MRS - Materials Research Society

Gras, A., Garcia-Cervantes, L., Martinez, G., Aguilar, J.M., Fernandez-Lisbona, E.

ESA Publications Division

Glembocki, O.J.

Materials Research Society

Paz, O., Bhat, K.N., Borrego, J.M.

North-Holland

Okamoto, Masako, Hashimoto, Shin, Hunt, B.D., Schowalter, L.J., Gibson, W.M.

Materials Research Society

Borrego, J. M., Ghandhi, S. K.

National Aeronautics and Space Administration

Duggan G., Moore K. J., Wlldbridge K., Roberts C., Pulsford N. J., Nicholas R. J.

Plenum Press

Borrego, J. M., Ghandhi, S. K.

National Aeronautics and Space Administration

Bullock,A.M., Barrington,J.M., Fitzgerald,C.M., Seavey,B., Dharamsi,A.N.

SPIE - The International Society for Optical Engineering

Yang, K., Schowalter, L.J., Thundat, T.G.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12