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Optically Detected Magnetic Resonance Investigations on Rapidly Thermally Oxidized Porous Silicon

Author(s):
Hofmann,D.M.
Meyer,B.K.
Stadle,W.
Kux,A.
Petrova-Koch,V.
Koch,F.
1 more
Publication title:
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
Title of ser.:
Materials science forum
Ser. no.:
143-147
Pub. date:
1994
Vol.:
Pt.3
Page(from):
1459
Page(to):
1462
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496716 [0878496718]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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