The Metastable Si:(S + Cu)Defect

Author(s):

Jeyanathan,L.

Davies,G.

Lightowlers,E.C.

Singh,M.

Sun,H.J.

Ittermann,B.

Ostapenko,S.S.

Barry,W.A.

Mason,P.

Watkins,G.D.

5 more

Publication title:

Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993

Title of ser.:

Materials science forum

Ser. no.:

143-147

Pub. Year:

1994

Vol.:

Pt.2

Page(from):

1167

Page(to):

1172

Pub. info.:

Zurich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496716 [0878496718]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings