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The Metastable Si:(S + Cu)Defect

Author(s):
Jeyanathan,L.
Davies,G.
Lightowlers,E.C.
Singh,M.
Sun,H.J.
Ittermann,B.
Ostapenko,S.S.
Barry,W.A.
Mason,P.
Watkins,G.D.
5 more
Publication title:
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
Title of ser.:
Materials science forum
Ser. no.:
143-147
Pub. date:
1994
Vol.:
Pt.2
Page(from):
1167
Page(to):
1172
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496716 [0878496718]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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