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The Physics and Application of Si:Er for Light Emitting Diodes

Author(s):
Michel,J.
Ren,F.Y.G.
Zheng,B.
Jacobson,D.C.
Poate,J.M.
Kimerling,L.C.(invited)
1 more
Publication title:
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
Title of ser.:
Materials science forum
Ser. no.:
143-147
Pub. Year:
1994
Vol.:
Pt.2
Page(from):
707
Page(to):
714
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496716 [0878496718]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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