The Influence of Silicon Diffusion on the Transport Properties of the 2DEG in Si ｦﾄ-Doped GaAs

Author(s):

• Koenraad,P.M.
• Barsony,I.
• Stadt,A.F.W.van der
• Perenboom,J.A.A.J.
• Wolter,J.H.

Publication title:

Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993

Title of ser.:

Materials science forum

Ser. no.:

143-147

Pub. Year:

1994

Vol.:

Pt.1

Page(from):

663

Page(to):

668

Pub. info.:

Zurich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496716 [0878496718]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings