Blank Cover Image

On the Microscopic Structures of Three Different Arsenic Antisite-Related Defects in Gallium Arsenide Studied by Optically Detected Electron Nuclear Double Resonance

Author(s):
Publication title:
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
Title of ser.:
Materials science forum
Ser. no.:
143-147
Pub. date:
1994
Vol.:
Pt.1
Page(from):
217
Page(to):
222
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496716 [0878496718]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Krambrock,K., Pinheiro,M.V.B., Wietzke,K.-H., Spaeth,J.-M.

Trans Tech Publications

Krambrock,K., Spaeth,J.-M.

Trans Tech Publications

Wietzke,K.-H., Koschnick,F.K., Spaeth,J.-M.

Trans Tech Publications

Spaeth, J> M., Hofmann, D. M., Meyer, B. K.

Materials Research Society

Lingner, T., Greulich-Weber, S., Spaeth, J.-M.

Trans Tech Publications

Wietzke,K.-H., Pinheiro,M.V.B., Koschnick,F.K., Krambrock,K., Spaeth,J.-M.

Trans Tech Publications

Krambrock,K., Corbel,C., Spaeth,J.-M.

Trans Tech Publications

HOFMANN,D.M., SPAETH,J.-M., MAYER,B.K.

Trans Tech Publications

Hofmann,D.M., Meyer,B.K., Pawlik,T., Alteheld,P., Spaeth,J.-M.

Trans Tech Publications

Krambrock,K., Pinheiro,M.V.B., Madeiros,S.M.

Trans Tech Publications

Dierolf,V., Spaeth,J.-M.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12