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Electronic Structure of PIn Antisite in InP

Author(s):
Chen,W.M.
Dreszer,P.
Leon,R.
Sorman,E.R.Weber E.
Monemar,B.
Liang,B.W.
Tu,C.W.
2 more
Publication title:
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
Title of ser.:
Materials science forum
Ser. no.:
143-147
Pub. Year:
1994
Vol.:
Pt.1
Page(from):
211
Page(to):
216
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496716 [0878496718]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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