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ODMR Studies of MOVPE-Grown GaN Epitaxial Layers

Author(s):
Kunzer,M.
Kaufmann,U.
Maier,K.
Schneider,J.
Herres,N.
Akasaki,I.
Amano,H.
2 more
Publication title:
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993
Title of ser.:
Materials science forum
Ser. no.:
143-147
Pub. date:
1994
Vol.:
Pt.1
Page(from):
87
Page(to):
92
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496716 [0878496718]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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