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Device reliability issues in field emission displays

Author(s):
Publication title:
Cockpit displays V : displays for defense applications : 15-17 April, 1998, Orlando, Florida
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3363
Pub. Year:
1998
Page(from):
236
Page(to):
243
Pub. info.:
Bellingham, Washington: SPIE
ISSN:
0277786X
ISBN:
9780819428127 [0819428124]
Language:
English
Call no.:
P63600/3363
Type:
Conference Proceedings

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