Method of one-dimensional optoelectronic high-speed detection on two-dimensional temperature field

Author(s):

• Wang,Q. ( Beijing Institute of Technology (China) )
• Chang,J. ( Beijing Institute of Technology (China) )
• Jiang,J. ( Beijing Institute of Technology (China) )
• Liu,X. ( Beijing Institute of Technology (China) )

Publication title:

Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3558

Pub. Year:

1998

Page(from):

105

Page(to):

109

Pub. info.:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819430199 [0819430196]

Language:

English

Call no.:

P63600/3558

Type:

Conference Proceedings