Blank Cover Image

Automated optical inspection for high-speed electron in synchrotron accelerator

Author(s):
  • Guo,C. ( Univ.of Science and Technology of China )
  • Liu,T. ( Univ.of Science and Technology of China )
  • Wang,R. ( Univ.of Science and Technology of China )
Publication title:
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3558
Pub. Year:
1998
Page(from):
81
Page(to):
86
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430199 [0819430196]
Language:
English
Call no.:
P63600/3558
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings The early study on the inspection of tongue of the traditional Chinese medicine using optical coherence tomography

H. Zhong, C. Zeng, Z. Guo, Y. He, R. Wang, S. Liu

SPIE - The International Society of Optical Engineering
7 Conference Proceedings Application of smart antennas in CDMA mobile communication system

Guo, C., Zhou, Y., Liu, T., Wang, R., Liu, S.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Fiber feedback system applied in synchrotron accelerator

Guo,C.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Automated inspection of carpets

J. Wang, R.A. Campbell, R.J. Harwood

Society of Photo-optical Instrumentation Engineers
3 Conference Proceedings Experimental observation of anomalous optical transmission fluctuations of thin metallic film/LiNbO3 substrate structures

Fu, J. Y., Wang, B., Liu, Y., Huang, C., Liu, H., Guo, R., Yu, F. T. S.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings A high-resolution contamination-mode inspection method providing a complete solution to the inspection challenges for advanced photomasks

Bhattacharyya, K., Huang, Y.-T., Son, K., Wang, D., Liu, L., Liao, C.H., Dai, Y.-M., Lin, J.-C.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings High-speed optical inspection of rapid prototyping parts

Moron,V., Boulanger,P., Masuda,T., Redarce,T.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Automated management for pavement inspection system (AMPIS)

Chung, H.C., Girardello, R., Soeller, T., Shinozuka, M.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings High-speed directly modulated and uncooled long-wavelength DFB semiconductor lasers

Wang, D., Zhang, J., Liu, T., Huang, X.-D., Li, C., Zhang, R.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings High-speed electron beam data verification system using high-performance neural network accelerator board

Tamura,T., Bouchon,D., Fournier,P., Moriizumi,K., Tanaka,K., Kyuma,K.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings High-speed fingerprint optical scanning method

Liu,W.W.C., Lin,H.C., Lin,C.S., Wang,H.L.

SPIE - The International Society for Optical Engineering
12 Conference Proceedings Automated Inspection and Reverse Engineering

Sobh T. M., Jaynes C., Dekhil M., Henderson T.

Springer-Verlag
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12