Blank Cover Image

Scannerless laser three-dimensional imaging method

Author(s):
  • Yan,H. ( Zhejiang Univ.(China) )
  • Lu,Z. ( Zhejiang Univ.(China) )
Publication title:
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3558
Pub. Year:
1998
Page(from):
49
Page(to):
52
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430199 [0819430196]
Language:
English
Call no.:
P63600/3558
Type:
Conference Proceedings

Similar Items:

Lu, Y., Chen, G., Chen, H.

SPIE - The International Society of Optical Engineering

Zhang X., Yan H., Zheng M.

SPIE - The International Society of Optical Engineering

An, C.W., Ye, K.D., Hong, M.H., Wang, W.J., Peng, Y.Z., Lu, Y.F.

SPIE-The International Society for Optical Engineering

H. Yan, M. Wang, Y. Ge, P. Yu

Society of Photo-optical Instrumentation Engineers

Schael,U., Rothe,H.

SPIE-The International Society for Optical Engineering

Schael, U., Rothe, H.

SPIE-The International Society for Optical Engineering

Schael,U., Rothe,H.

SPIE-The International Society for Optical Engineering

Bursanescu,L., Hamdi,M.

SPIE - The International Society for Optical Engineering

Sun,H., Lu,H.

SPIE-The International Society for Optical Engineering

Yu, H., Kearney, F. R., Dlott, D. D.

SPIE - The International Society of Optical Engineering

Burns,H.N., Steiner,T.D., Hayden,D.R.

SPIE-The International Society for Optical Engineering

Richmond,R.D., Stettner,R., Bailey,H.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12