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Visible automeasurement of positional accuracy to compiex objects

Author(s):
Shen,B. ( Hubei Institute of Technology (China) )
Tian,C. ( Hubei Institute of Technology (China) )
Tang,M. ( Hubei Institute of Technology (China) )
Yang,Y. ( Hubei Institute of Technology (China) )
Cheng,J. ( Hubei Institute of Technology (China) )
Shen,L. ( Computer Ctr. of Wuhan Railway (China) )
1 more
Publication title:
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3558
Pub. Year:
1998
Page(from):
31
Page(to):
38
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430199 [0819430196]
Language:
English
Call no.:
P63600/3558
Type:
Conference Proceedings

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