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Study of grain boundaries in YBCO thin films using microraman spectroscopy

Author(s):
Martinez, O. ( Fisica de la Materia Condensada, ETS Ingenieros Industriales )
Jimenez, J. ( Fisica de la Materia Condensada, ETS Ingenieros Industriales )
Martin, P. ( Fisica de la Materia Condensada, ETS Ingenieros Industriales )
Chambonnet, D. ( Alcatel Alsthom )
Degoy, S. ( Alcatel Alsthom )
Belouet, C. ( Alcatel Alsthom )
1 more
Publication title:
Epitaxial oxide thin films II : symposium held November 26-30, 1995, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
401
Pub. date:
1996
Page(from):
405
Page(to):
410
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558993044 [1558993045]
Language:
English
Call no.:
M23500/401
Type:
Conference Proceedings

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